Common-Refection-Surface (CRS) Stacking with Diffraction Moveouts of Varying Aperture
J.H. Faccipieri, T.A. Coimbra, M. Tygel and L.J. Gelius
Event name: 76th EAGE Conference and Exhibition - Workshops
Session: WS11 - Multi-parameter Processing and Imaging
Publication date: 16 June 2014
Info: Abstract, PDF ( 509.88Kb )
A modified version of the CRS stacking method based on diffraction moveouts with different midpoint and half-offset apertures is shown to provide clean stacked sections of reflection and diffraction events. Moreover, as the CRS diffraction moveout depends on fewer parameters than its counterpart conventional reflection moveout, the proposed approach also benefits from less computation effort. Illustrative real-data examples are provide showing good potential of the proposed approach.