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Super-resolution by Moveout Correction and Migration of Surface-related Resonant MultiplesNormal access

Authors: B. Guo, Y. Huang and G.T. Schuster
Event name: 77th EAGE Conference and Exhibition - Workshops
Session: WS06 - Seismic Imaging - Latest Developments
Publication date: 01 June 2015
DOI: 10.3997/2214-4609.201413505
Organisations: EAGE
Language: English
Info: Extended abstract, PDF ( 1.33Mb )
Price: € 20

Summary:
Surface-related resonant multiples can be migrated to achieve better resolution than primary reflection data. However, such multiples are only recorded by near-offset traces. As a result, the migration image using resonant multiples suffers from poor signal-to-noise ratio. In this report, I mitigate this problem by aligning the first-order surface-related multiples across different offsets with the zero-offset resonant multiples. Such an alignment is based on the moveout characteristics of the first-order surface-related multiples. Stacking the aligned multiples improves the signal-to-noise ratio of the zero-offset resonant multiples as well as the resulting migration image. Results with both synthetic and field data results validate this method and show migration images with super-resolution characteristics.


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