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Sensitivity Analysis of Rayleigh-wave Ellipticity with Application to Near Surface CharacterizationNormal access

Author: M. Cercato
Event name: Near Surface Geoscience 2015 - 21st European Meeting of Environmental and Engineering Geophysics
Session: Applied Geophysics for Seismic Hazard II
Publication date: 06 September 2015
DOI: 10.3997/2214-4609.201413713
Organisations: EAGE
Language: English
Info: Extended abstract, PDF ( 1.27Mb )
Price: € 20

Summary:
The joint inversion of surface-wave measurements and Rayleigh-wave ellipticity has gained popularity in recent years for near-surface soil characterization. The common approach is to use low-frequency, single-station ellipticity data in conjunction with high-frequency dispersion measurements obtained employing small aperture arrays. A complete understanding of the diagnostic potential of ellipticity in such conditions can be assessed only with a complete sensitivity analysis. To this end, a new analytical method is presented for computing the sensitivity of Rayleigh-wave ellipticity with respect to the structural parameters of a layered elastic halfspace. This method employs a layer stacking procedure based on the subdeterminant formulation of the surface-wave forward problem and is numerically stable at high frequencies. The sensitivity of the ellipticity curve is then evaluated quantitatively with specific focus on near-surface examples and compared to the dispersion patterns and sensitivity of modal phase velocity.


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