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Pseudoreflection profiling method: an efficient complement to CDP method
Author: Tomoki Tsutsui
Journal name: Geophysical Prospecting
Issue: Vol 40, No 1, January 1992, pp. 15 - 30
DOI: 10.1111/j.1365-2478.1992.tb00362.x
Info: Article, pdf PDF (882.94Kb)
Language: English

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